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Equipment Info
Scanning probe microscope facility II at Physics
Note: Equipment is Down.
Equipment Code : 2745962
Make : Bruker (Previously Veeco)
Model : Multimode Nanoscope IV
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details :
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : https://instruments.iitb.ac.in/scanning-probe-microscope-facility-ii-physics
Description : Scanning Probe Microscope facility is used to characterize surfaces and structure at nanoscale using variety of physical probes. The facility includes Atomic Force Microscopy (AFM), Scanning Tunneling microscope (STM) etc.
| Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) |
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SPM
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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