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Equipment Info
Conductive atomic force microscope facility
Equipment Code : 2746048
Make : Asylum/Oxford Instruments
Model : MFP3D Origin
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details :
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : https://instruments.iitb.ac.in/conductive-atomic-force-microscope-facility
Description : This facility s a technique that uses a AFM tip to measure the topography of a sample surface along with its local electrical conductivity. This facility was installed in Aug 2015 and is widely used to study the electrical properties of materials like semiconductors, nanomaterials, organic electronics etc.
Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) |
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cAFM (minimum of 3 Hours slot)
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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No Data Available |
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