Workshop on Focused Ion Beam-Scanning Electron Microscopy

Collaborative : Thermo Fisher Scientific Pvt Ltd.

Event Scope :

About FOCUSED ION BEAM-SCANNING ELECTRON MICROSCOPE:

Information at the nanoscale level has become extremely necessary for the characterization of a wide range of samples and materials. The field of research faces challenges especially for bulk samples due to certain limitations of conventional sample preparation techniques. The emergence of Focused Ion Beam-Scanning Electron Microscope (commonly called FIB-SEM) has addressed these challenges by combining the precise sample preparation technique using FIB and the high-resolution imaging using SEM.

CAPABILITIES & TECHNIQUES OF FIB-SEM:

1. TEM lamella preparation
2. Site specific cross sectional imaging, 3D slice and view
3. Precision machining for micro tools
4. HR imaging, Low kV HR imaging, SEM/STEM imaging, Ion beam imaging
5. Nano-fabrication and Nano-patterning

Event Brief :

Expert Speakers

Schedule/Agenda

Addtional Info