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Equipment Info
Stylus Profilometer
Equipment Code : 2736842
Make : Bruker
Model : Dektak XT
Institution : Sophisticated Analytical Instrument Facilities (SAIF) IIT Bombay
Department : SAIF
Funding Agency Details : DST, Govt. of India
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : www.saif.iitb.ac.in
Description : The DektakXT stylus surface profiler is an advanced thin and thick film step height measurement tool.Stylus profilometers also use to detect the surface roughness. The DektakXT system takes measurements electromechanically by moving a diamond ā€“tipped stylus over the sample surface according to user-programmed scan length, speed and stylus force.
Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) | IAP Member | Academic (Internal but different department/lab) |
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1D or 2D scan
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3D Scan(Mapping per Hour)
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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No Data Available |
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