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Equipment Info
Central surface analytical facility-ESCA Facillity
Equipment Code : 2745746
Make : Kratos Analytical
Model : AXIS Supra
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details : Institution
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : https://instruments.iitb.ac.in/central-surface-analytical-facility-esca-facillity
Description : Make: Kratos Analytical, UK (SHIMADZU group) Model: AXIS SupraTwo chamber ultra high vacuum system: Analysis chamber (< 2.0 x 10-9 Torr) and Sample load-lock chamber (< 5.0 x 10-8 Torr)Automated sample transfer mechanism and five-axis sample manipulator.XPS source: Monochromatic (AlK?) 600 W X-ray source; 1486.6 eVUPS source: High photon flux He gas discharge lamp (He-I 21.2 eV and He-II at 40.8 eV)Auger: Field emission gun for Auger electron spectroscopy and Scanning Auger microscopy. Source energy range up to 10 kVElectron energy analyser and detector: Concentric hemispherical analyzer (CHA) for spectroscopy, and Spherical mirror analyzer for parallel imaging. Multichannel plates stack with delay-line detector for counting. Spectroscopy, snapshot and imaging modes with option of large area and small area analysis.Differentially pumped ion gun: High performance gun for precision depth profiling, Energy range 500 eV to 4 keV for sample etching (cleaning) and depth profilingSample
| Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) | IAP Member | Academic (Internal but different department/lab) |
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XPS
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UPS
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XPS + depth profiling
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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