
Enter the captcha to process the search!
Equipment Info
X ray Diffractometer Facility at MEMS
Equipment Code : 2745812
Make : Empyrean
Model : Empyrean
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details :
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : https://instruments.iitb.ac.in/x-ray-diffractometer-facility-mems
Description : x- ray Diffraction(XRD ) is a versatile non -destructive analytical technique used to analyze physical properties such as phase composition , crystal stucture and orientation of powder solid samples. Phase identication can be performed by comparing x-ray diffraction patterns obtained from unkmown samples to patterns in reference database.
Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) |
---|---|---|---|---|---|---|---|
Normal theta to two theta Scan (maximum 15minutes per sample)
|
|
|
|
|
|||
GI-XRD (maximum15minutes per sample)
|
|
|
|
|
|||
HT-XRD (maximum15minutes per sample)
|
|
|
|
|
|||
SAXS (maximum15minutes per sample)
|
|
|
|
|
Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
---|---|---|---|---|---|---|
No Data Available |
Copyright © 2025 I-STEM. All rights reserved Hosted at the National Informatics Centre, Delhi, India Audited by: STQC Bengaluru as on 26 Sep 2024