Equipment Info

Conductive atomic force microscope facility

Equipment Code : 2746048

Make : Asylum/Oxford Instruments

Model : MFP3D Origin

Institution : Indian Institute of Technology (IIT) Bombay

Department : Centre for Sophisticated Instruments and Facilities

Funding Agency Details :

Pooling of Equipment slot :   No

Last AMC Done :  

Reference Website : https://instruments.iitb.ac.in/conductive-atomic-force-microscope-facility

Description : This facility s a technique that uses a AFM tip to measure the topography of a sample surface along with its local electrical conductivity. This facility was installed in Aug 2015 and is widely used to study the electrical properties of materials like semiconductors, nanomaterials, organic electronics etc.

Usage Rate: (as indicated by the custodian/host institution)

Samples External Academic User Internal Academic User International User Industry User Start-ups National Research Lab User Self (Project Investigator)
cAFM (minimum of 3 Hours slot)

Note:

i) Academic (External) means researchers belongs to the other institution.

ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.

iii) Academic (Internal) means researchers belongs to the same institution.


Accessories / Consumables / Spare parts / Testing modes
Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available