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Equipment Info
Atomic Force Microscopy Park NX20
Equipment Code : 2746207
Make : Park Systems
Model : NX20
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details :
Pooling of Equipment slot : No
Last AMC Done :
Reference Website : https://instruments.iitb.ac.in/atomic-force-microscopy-park-nx20
Description : The Atomic Force Microscopy (AFM) Facility is a specialized laboratory equipped for high-resolution surface characterization, nanomechanical measurements, and molecular interactions at the nanoscale. The facility supports a broad range of research applications in materials science, biology, and biophysics.Key Features and Capabilities:High-Resolution Imaging: Enables topographical mapping of surfaces with nanometer-scale resolution.Force Spectroscopy: Measures mechanical properties such as stiffness, elasticity, and adhesion forces at the molecular level.Modes of Operation: Includes contact mode, tapping mode, and non-contact mode for diverse sample analysis.Environmental Control: Options for imaging in ambient air, liquid environments, and controlled atmospheres for biological and material studies.Advanced Data Analysis: Software for quantitative analysis of surface roughness, particle size, and force-distance curves.Multi-Sample Compatibility: Capable of analyzing biological samples
| Samples | External Academic User | Internal Academic User | International User | Industry User | Start-ups | National Research Lab User | Self (Project Investigator) |
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AFM (max 3Hrs slot (Max sample 3/Slot))
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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