Event View

16 March 2023

Talk to Experts: Deep-Level Transient Spectroscopy (DLTS): Defect and Impurity Analysis in Semiconductors

Webinar
Presented by : Indian Science Technology and Engineering facilities Map (I-STEM)
Topic : DTLS and its application in Defect and Impurity Analysis in Semiconductors  Code : 520ISTEM23901

About

Collaborative : Indian Science Technology and Engineering facilities Map (I-STEM)

Starts On : 16-03-2023

Ends On : 16-03-2023

Last Enrollment : 16-03-2023

Event Organiser
Indian Science Technology and Engineering facilities Map (I-STEM)
  istem.india@gmail.com
  8022932680
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